SoyBase Follow us on Twitter @SoyBaseDatabase
Integrating Genetics and Genomics to Advance Soybean Research

Phomopsis seed decay 1-1
Parent 1:PI417479
Parent 2:AP350
Heritability:0.51
Num loci tested:43
Percent Variation Explained:23
Trait name:Reaction to Diaporthe phaseolorum var sojae Infection

Controlled vocabulary terms associated with the QTL
SourceAccession Number
Plant Trait OntologyTO:0000439

     
Other names for the QTL
PSD 1-1

References for the QTL
Berger and Minor 1999An RFLP marker associated with resistance to phomopsis seed decay in soybean PI 417479 
Crop Sci. 1999, 39(3):800-805

     
Maps containing Phomopsis seed decay 1-1
MapLGStartEnd
GmComposite2003_F F83.1785.17See this QTL region in Sequence Browser

Loci positively associated with the QTL
A708_1Parent_123.8% decay
A708_1Parent_246.9% decay
A708_1Heterozygous31.4% decay
A708_1Phenotypic_R223.200001
A708_1P_value0.000100
A708_1Genetic_effectsDominant
A708_1Favorable_allele_sourcePI417479

Population types used in identification of the QTL
F2 and F2:4

Parent trait values associated with the QTL
ParentTrait
PI417479Resistant
AP350Susceptible

Loci associated with the QTL
A708_1

Methods used to identify the QTL
ANOVA

Comments about the QTL
Data are for 1993; see reference for other years
Parent_1 is PI417479, Parent_2 is AP350
Study done by analysis of variance at locus; for purposes of display this was converted to an interval around that locus.
Phomopsis seed decay (PSD) is caused by members of the Diaporthe/Phomopsis genus.






Funded by the USDA-ARS. Developed by the USDA-ARS SoyBase and Legume Clade Database group at the Iowa State University, Ames, IA
 
USDA Logo
Iowa State University Logo